Syllabus
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1. Basic principles Methods overview, instrumentation (electron optics, radiation sources, analyzers, detectors), vacuum requirements (mean free path, influence of surface adsotrption, ...), samples (types, requrements, preparation methods), impact of radiation on surface compostion and structure and its elimination. *
2. Electron transport in solids Elastic and inelastic interactions, interaction volume, attenuation depth, mean inelastic attenuation path, information depth. *
3. Auger electron spectroscopy History, Auger de-excitation mechanism, experimental systems, qualitative analysis (energy and shape of Auger peaks), quantitative analysis (Auger emission intensity). *
4. Energy loss spectroscopy EELS - instrumentation, ionization and plasmon losses, interband/intraband transitions, extended fine structure, adsorbate induced losses HREELS - instrumentation, electron scattering mechanism, examples of experimental results. *
5. Photoelectron Spectroscopy History and common principles, photoionisation process, photoelectric effect. XPS - instrumentation, qualitative and quantitative analysis, initial and final state effects, angle resolved spectroscopy (ARXPS). UPS - instrumentation, clean surfaces and adsorbates, band structure, angle resolved spectroscopy (ARUPS). Synchrotron-radiation based methods - SRPES, HAXPES, ARPES, RPES. IPE (Internal Photoemission Spectroscopy) - principle, instrumentation, applications. *
6. Supplement (obsolete methods, state-of-the-art and modern versions of classical methods) Appearance potential spectroscopy (APS), Elastic peak electron spectroscopy (EPES), Two-photon photoemission spectroscopy (2PPE), Ion neutralization spectroscopy (INS), Field emission electron spectroscopy (FES), Near edge X-ray absorption fine structure (NEXAFS). El. spectroscopies in microscopic metods: EDX and WDX in SEM, TEM, STEM; LEEM (SPELEEM, IV char., energ. filter); STS in STM. Operando methods - NAP-XPS, NAP-PES.
Annotation
Auger Electron Spectroscopy (AES) Energy Loss Spectroscopy (ELS) a Photoelectron Spectroscopy (XPS, UPS), Inverse photoemission.