Syllabus
1. X-ray sources Laboratory sources, rotation anodes, synchrotron radiation, neutron sources
2. Monochromatization Filters, monochromators
3. Detection of radiation Films, point, linear, area detectors
4. Single crystal methods Film methods - Laue (orientation of crystal), Weissenberg, rotating crystal, precession Difractometers - Eulerian cradle, kappa geometry
5. Film powder methods - Debye-Scherrer methods, Guinier
6. Information in powder diffraction pattern. Basic methods of powder diffraction - structure refinement, qualitative and quantitative phase analysis, study of lattice parameters, thermal vibrations, crystallite size and strain.
7. Powder diffraction pattern - data reduction. Determination of line profile parameters by the direct method and fitting.
8. Diffraction geometries. Conventional powder method, psi and omega goniometers, Seemann-Bohlin goniometer, influence of instrumental factors and absorption, penetration depth
9. Phase identification
10. Qualitative and qunatitative phase analysis
11. Lattice parameters
12. Rietveld method and structure refinement
13. Residual stress determination Classification of stresses, stress description, sin^2 psi method. Stress measurements
14. Textures ODF, texture measurements with texture goniometer, fiber textures and their characterization with conventional diffractometer (psi and omega scans)
15. Line profile analysis Correction on instrumental broadening, size-strain separation.
16. Study of size, shape and distribution of crystallites in the range of 5 nm - 10000 nm.
17. Study of amorphous materials Diffraction and EXAFS
18. Basic methods of structure solution Patterson methods, heavy-atom method. Direct methods.
Annotation
X-Ray generators, detectors. Monochromatization. Basic single crystal methods. Film powder methods. Different diffraction geometries. Powder diffraction pattern and its evaluation Identification of unknown phases - qualitative and quantitative phase analysis. Precise measurement of lattice parameters. Rietveld method. Basic methods for texture and stress analysis. XRD profile analysis. Methods of structure solution. Structure of amorphous materials.
Modern methods of X-ray imaging.