Publications
- In-situ X-ray diffraction studies of time and thickness dependence of crystallization of amorphous TiO2 thin films and stress evolution2010 | Faculty of Mathematics and Physics
- XRD total pattern fitting applied to study of microstructure of TiO2 films2010 | Faculty of Mathematics and Physics
- XRD study of thickness dependence of crystallization and stresses in TiO2 thin films2009 | Faculty of Mathematics and Physics
- Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction2009 | Faculty of Mathematics and Physics
- Crystallization and Microstructure Evolution of TiO2 Thin Films and Powders Studied by XRD Total Pattern Fitting and Stress Analysis2009 | Faculty of Mathematics and Physics
- Time and thickness dependence of crystallization of amorphous magnetron deposited TiO2 thin films2009 | Faculty of Mathematics and Physics
- In-Situ Study of Time and Thickness Dependence of Crystallization of Amorphous TiO2 Thin Films and Powders.2009 | Faculty of Mathematics and Physics
- Magnetron Deposited TiO2 Thin Films - Crystallization and Temperature Dependence of Microstructure and Phase Composition2008 | Faculty of Mathematics and Physics
- In-situ XRD astudy of thickness dependence of amorphous and nanocrystalline magnetron deposited TiO2 thin films2008 | Faculty of Mathematics and Physics
- Complex XRD studies of crystallization of amorphous and nanocrystalline magnetron-deposited TiO2 films with different thickness2008 | Faculty of Mathematics and Physics
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