Publikace
- XRD study of strongly textured and stressed thin films2005 | Matematicko-fyzikální fakulta, Ústřední knihovna
- Fitting of reciprocal space maps of thin films with texture and stress2004 | Matematicko-fyzikální fakulta
- Fitting of the reciprocal space maps for stressed and textured thin films +12002 | Publikace bez příslušnosti k fakult ě
- Study of submicrocrystalline materials by conventional powder diffraction and diffuse scattering in transmitted wave2004 | Matematicko-fyzikální fakulta
- Study of submicrocrystalline materials by diffuse scattering in transmitted wave2003 | Matematicko-fyzikální fakulta
- Fitování map reciprokého prostoru. Analýza vrstev TiB22003 | Matematicko-fyzikální fakulta
- Degradation of periodic multilayers as seen by small-angle X-ray scattering and X-ray diffraction Degradation of periodic multilayers as seen by small-angle X-ray scattering and X-ray diffraction2002 | Publikace bez příslušnosti k fakultě
- Microstructure of BaxSr1xTiO3 thin films grown on sapphire substrates2002 | Publikace bez příslušnosti k fakultě
- Structural studies of submicrocrystalline materials prepared by high-pressure torsion deformation2002 | Publikace bez příslušnosti k fakultě
- Study of submicrocrystalline materials by conventional powder diffraction and diffuse scattering in transmitted wave2002 | Publikace bez příslušnosti k fakultě
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