Classes
Publications
- Method for determination of diffusion length of minority carriers in silicon wafers by measurement of the surface photovoltage.Publication without faculty affiliation
- The influence of surface roughness on the presence of polymorphs and defect states in P3HT layers2022 | Faculty of Mathematics and Physics
- Explanation of the high conductivity of HCl protonated polyaniline films2021 | Faculty of Mathematics and Physics
- Use of flicker noise in polyaniline to determine the product of mobility and lifetime of charge carriers2021 | Faculty of Mathematics and Physics
- New view on the origin of high conductivity of polyaniline films protonated by hydrochloric acid2020 | Faculty of Mathematics and Physics
- An experimental and theoretical study of the structural ordering of the PTB7 polymer at a mesoscopic scale2019 | Faculty of Mathematics and Physics
- Mobility of Holes and Polarons in Polyaniline Thin Films Determined by Impedance Spectroscopy Measurements2018 | Faculty of Mathematics and Physics
- Direct measurement of exciton dissociation energy in polymers2017 | Faculty of Mathematics and Physics
- Mobility of holes and polarons in polyaniline films assessed by frequency-dependent impedance and charge extraction by linearly increasing voltage2017 | Faculty of Mathematics and Physics
- Comparison of the electron work function, hole concentration and exciton diffusion length for P3HT and PT prepared by thermal or acid cleavage2016 | Faculty of Mathematics and Physics, Faculty of Science
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