Publikace
- Interference phenomena observed by X-ray diffraction in nanocrystalline thin films2004 | Matematicko-fyzikální fakulta
- X-ray diffraction on nanocrystalline Ti1-xAlxN thin films2004 | Matematicko-fyzikální fakulta
- X-ray Diffraction and X-ray Reflectivity Applied to Investigation of Thin Film2001 | Matematicko-fyzikální fakulta
- X-ray diffraction and X-ray reflectivity applied to investigation of thin films2001 | Matematicko-fyzikální fakulta
- Long-range periodicity and disorder in two-dimensional arrays of metallic dots studied by x-ray diffraction2000 | Matematicko-fyzikální fakulta
- Convolution and deconvolution in the X-ray diffraction analysis2000 | Matematicko-fyzikální fakulta
- Soft-mode spectroscopy of BaTiO3 thin films2005 | Matematicko-fyzikální fakulta
- Coherence effects in nanocrystalline Ti-Al-Si-N thin films2005 | Matematicko-fyzikální fakulta
- On the preferred orientation in Ti1-xAlxN and Ti1-x-yAlxSiyN thin films2005 | Matematicko-fyzikální fakulta
- Real structure and magnetic properties of UN thin films2005 | Matematicko-fyzikální fakulta
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