Positron lifetime calculation for stacking fault tetrahedra in copper

Abstract

We investigate the positron response of simulated stacking fault tetrahedra in Cu. We find that in both the regular and truncated stacking fault tetrahedra positron lifetimes are about 10-15 ps larger than the bulk lifetime.

This is an indication that the vacancy-like defects observed in neutron irradiated Cu by positron annihilation lifetime measurements do not arise during the formation of the stacking fault tetrahedra but rather during the interaction of the stacking fault tetrahedra with other defects.

Keywords

• Copper
• Stacking fault tetrahedra
• Theoretical calculations of positron parameters.