Publikace na Matematicko-fyzikální fakulta |
2011
Abstrakt
Theoretical description of x-ray scattering from nanostructures is briefly summarized. The application of x-ray scattering for the investigation of the structure of nanocrystals is demonstrated by two characteristic examples comprising standard small-angle x-ray scattering from nanocrystals in an amorphous matrix and x-ray diffraction from crystalline inclusions in an epitaxial layer.
New synchrotron-based x-ray scattering methods are briefly discussed.