Cu6PS5I thin films were deposited onto silicate glass substrates by non-reactive radio frequency magnetron sputtering. Spectrometric and isoabsorption studies of Cu6PS5I thin films in the temperature interval 77-500 K were performed.
Structural studies were carried out using X-ray diffraction and scanning electron microscopy techniques. Temperature evolution of optical transmission spectra as well as temperature dependences of optical pseudogap and Urbach energy is investigated.
The influence of temperature-related and structural disordering on the Urbach tail is studied.