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Interpretation of minority carrier diffusion length measurements in thin silicon wafers
Publication at Faculty of Mathematics and Physics, Central Library of Charles University
|
2003
3 people
Abstract
Interpretation of minority carrier diffusion length measurements in thin silicon wafers
People
person
doc. RNDr. Jana Toušková CSc.
Faculty of Mathematics and Physics
person
doc. RNDr. Jiří Toušek CSc.
Faculty of Mathematics and Physics
person
Serhiy Dolhov
Person without faculty affiliation
