X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires | Charles Explorer

X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires

Publikace na Matematicko-fyzikální fakulta |

2003

Abstrakt

X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires

Osoby