Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles | Charles Explorer

Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles

Publication at Faculty of Mathematics and Physics, Central Library of Charles University |

2001

Abstract

Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles

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