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Structural characterization of Pd thin film growth on Al2O3 using photoelectron and ion spectroscopy
Publication at Faculty of Mathematics and Physics
|
2000
4 people
Abstract
Structural characterization of Pd thin film growth on Al2O3 using photoelectron and ion spectroscopy
People
person
RNDr. Kateřina Veltruská CSc.
Faculty of Mathematics and Physics
person
prof. RNDr. Vladimír Matolín DrSc.
Faculty of Mathematics and Physics
person
Ing. Nataliya Tsud Ph.D.
Faculty of Mathematics and Physics
person
David Bača
Person without faculty affiliation
