Abstract
This work is focused on a detailed study of pulsed mode infrared light induced depolarization of CdZnTe detectors operating at high photon fluxes. This depolarizing effect is a result of the decrease of positive space charge that is caused by the trapping of photogenerated holes at a deep level.
The reduction in positive space charge is due to the optical transition of electrons from a valence band to the deep level due to additional infrared illumination. In this paper, we present the results of pulse mode infrared depolarization, by which it is possible to keep the detector in the depolarized state during its operation.
The demonstrated mechanism represents a promising way to increase the charge collection efficiency of CdZnTe X-ray detectors operating at high photon fluxes. (C) 2015 AIP Publishing LLC.