Mobility of Holes and Polarons in Polyaniline Thin Films Determined by Impedance Spectroscopy Measurements
2018
Abstract
Impedance spectroscopy measurements were performed on polyaniline layers deposited on silicon substrates in the range of 110 Hz - 1 MHz. Different bias voltages were used during the experiment displaying regions of holes and polarons contributions to the mobility.
The spectra had a character of space charge limited currents. Shift of the maximum of the spectra followed Poole-Frenkel law.
Obtained results were compared with mobility estimated by CELIV measurements.