Publication at Faculty of Mathematics and Physics |
2009
Abstract
The purpose of this study was to contribute to the elucidation of the Sn-Ce interaction mechanism in mixed oxides prepared by simultaneous magnetron sputtering of ceria and tin. Non-reactive rf magnetron sputtering was used to deposit CeO2 and Sn-CeO2 thin films on Si(1 0 0) wafer substrates. The prepared samples were investigated by secondary ion mass spectroscopy (SIMS) and X-ray photoelectron spectroscopy (XPS) using a conventional laboratory X-ray source