Structural Investigations of Core-Shell Nanowires Using Grazing Incidence X-Ray Diffraction

Abstract

Internal structure of semiconductor nanowires was studied by x-ray grazing-incidence x-ray diffraction and x-ray small-angle scattering

Keywords

• Structural
• Investigations
• Core-Shell
• Nanowires
• Using
• Grazing
• Incidence
• X-Ray
• Diffraction