Ultra-thin oxide layer formation on Cu-9%Al(111) surface and Pd growth studied using reflection high energy electron diffraction and Auger electron spectroscopy

Abstract

annotation in the original language Ultra-thin oxide layer formation on Cu-9%Al(111) surface and Pd growth studied using reflection high energy electron diffraction and Auger electron spectroscopy

Keywords

• Ultra-thin
• oxide
• layer
• formation
• Cu-9%Al
• surface
• growth
• studied
• using
• reflection
• energy
• electron
• diffraction
• Auger
• electron
• spectroscopy