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Secondary electron emission from highly charged carbon grains

Publication at Faculty of Mathematics and Physics |
2009

Abstract

The paper deals with investigations of secondary emission of 1-6 micro-meter spherical grains from amorphous carbon under the electric field of the order of 108 V/m. The secondary emission yield increases with the electric field at the sample surface linearly and does not depend on the grain diameter.

Long-lasting (hours) electron irradiation of the sample surface leads to a significant decrease of the yield