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Characterization of various crystalline structures at the SiO2/Si interface by positrons
Publication at Faculty of Mathematics and Physics
|
2007
3 people
Abstract
Characterization of various crystalline structures at the SiO2/Si interface by positrons
Keywords
Characterization
various
crystalline
structures
SiO2/Si
interface
positrons
People
person
Ing. Oksana Melikhova Ph.D.
Faculty of Mathematics and Physics
person
doc. Ing. František Bečvář DrSc.
Faculty of Mathematics and Physics
person
RNDr. Jan Kuriplach CSc.
Faculty of Mathematics and Physics
