Reduction of Structure Defects in (CdZn)Te Substrates by Post-grown annealing

Abstract

Influence of Cd-rich and Te-rich annealing on morfology of inclusions and precipitates in (CdZn)Te substrates used for preparation of infrared detectors.

Keywords

• Reduction
• Structure
• Defects
• Substrates
• Post-grown
• annealing