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x-ray-diffraction
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Study of thin epitaxial layers by X-ray diffraction and reflection
Publication
|
2005
1 person
Abstract
Study of thin epitaxial layers by X-ray diffraction and reflection
Keywords
Study
epitaxial
layers
X-ray
diffraction
reflection
Person
person
doc. RNDr. Stanislav Daniš Ph.D.
Faculty of Mathematics and Physics