- Mapování reciprokého prostoru pro simultánní určení textury a napětí v tenkých vrstvách2006 | Matematicko-fyzikální fakulta
- Three-dimensional reciprocal space mapping with a two-dimensional detector as a low-latency tool for investigating the influence of growth parameters on defects in semipolar GaN2015 | Matematicko-fyzikální fakulta
- Fitting of reciprocal space maps of thin films with texture and stress2004 | Matematicko-fyzikální fakulta
- Fitování map reciprokého prostoru. Analýza vrstev TiB22003 | Matematicko-fyzikální fakulta
- Fitting of the reciprocal space maps for stressed and textured thin films +12002 | Publikace bez příslušnosti k fakultě
- Study of threading dislocation density reduction in AlGaN epilayers by Monte Carlo simulation of high-resolution reciprocal-space maps of a two-layer system2013 | Matematicko-fyzikální fakulta
- Microstructure of Hexagonal LuFeO3 Thin Epitaxial Layers2022 | Matematicko-fyzikální fakulta
- Strain relaxation in InGaN/GaN epilayers by formation of V-pit detects studied by SEM, XRD and numerical simulations2021 | Matematicko-fyzikální fakulta
- Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar (11(2)over-bar2) GaN layers grown from the sidewall of an r-patterned sapphire substrate2013 | Matematicko-fyzikální fakulta
- High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure2013 | Matematicko-fyzikální fakulta
- Density of bunched threading dislocations in epitaxial GaN layers as determined using X-ray diffraction2018 | Matematicko-fyzikální fakulta
- DIFFUSION OF Mn INTERSTITIAL IONS IN GaMnAs2019 | Matematicko-fyzikální fakulta
- The misfit dislocation density profile in graded SiGe/Si(001) layers prepared at different temperatures2013 | Matematicko-fyzikální fakulta
- Diffuse X-ray scattering from local chemical inhomogeneities in InGaN layers2018 | Matematicko-fyzikální fakulta
- Grazing-incidence x-ray diffraction from GaN epitaxial layers withthreading dislocations2011 | Matematicko-fyzikální fakulta
- Strain relaxation of InGaN/GaN Strain relaxation of InGaN/GaN by formation of V-pits by formation of V-pits2019 | Matematicko-fyzikální fakulta
- Growth, Structure, and Electronic Properties of Epitaxial Bismuth Telluride Topological Insulator Films on BaF2 (111) Substrates2013 | Matematicko-fyzikální fakulta
- Growth of omega inclusions in Ti alloys: An X-ray diffraction study2013 | Matematicko-fyzikální fakulta
- Single crystal growth of TIMETAL LCB titanium alloy by a floating zone method2014 | Matematicko-fyzikální fakulta
- Coherent X-ray diffraction imaging meets ptychography to study core-shell-shell nanowires2018 | Matematicko-fyzikální fakulta
- Structure Quality of LuFeO3 Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt2020 | Matematicko-fyzikální fakulta
- Observation of Anomalously Large Magnetoelectric Coupling in the Hexagonal Z-Type Ferrite Films2022 | Matematicko-fyzikální fakulta, Přírodovědecká fakulta
- Relaxation of Strain in Terbium Iron Garnet Layers Detected by Magneto-optical Kerr Effect Spectroscopy2023 | Matematicko-fyzikální fakulta
- Magnetism and spin transport in rare-earth-rich epitaxial terbium and europium iron garnet films2018 | Matematicko-fyzikální fakulta